Clemex Vision PE Complete Image Analysis Software
NEW 5.0

11th September 2008


Système d'analyse d'image Vision PE

Particle & Surface Sciences are pleased to announce the powerful image analysis software, Clemex Vision PE.   This is available as a stand-alone solution or part of a turnkey image analysis system including all necessary hardware components.    A Clemex turnkey image analysis system is comprised of Clemex Vision image analysis software, a digital camera and coupler, microscope, high-performance PC, and motorized x,y,z stage. As a tightly integrated system, component settings are easily controlled from Clemex Vision PE or Vision Lite software.

From measuring grain size to counting particles, Clemex Vision is an intuitive software program that empowers you to easily develop custom image analysis macros without writing a single line of code!

New 5.0 features Include :

Auto calibration
Automatic exposure
Virtual joystick
Circular Stage Pattern
Automatic Object Separation
User Right Management
Contrast Thresholding
Manual Separation (improved)
Viewing Backgrounds in the Stage Window
Auto Focus with Mask Area

A leading source of image analysis solutions for quantitative microscopy, Clemex Technologies Inc. provides image analysis systems and image analysis software for quality control and research laboratories. Major corporations around the world in manufacturing, pharmaceuticals, aerospace, automotive, and research use Clemex products.  Please contact Particle & Surface Sciences and we will be happy to assist you with your particular application and answer any questions you may have.


                                                                                                                                                                                                                                                                                                                                                                                                                           

Last Updated on Saturday, 20 November 2010 07:42